Talos F200X STEM system combines outstanding high-resolution STEM and TEM imaging with industry-leading energy dispersive X-ray spectroscopy   signal detection. 2D/3D chemical characterization with compositional mapping is performed by 4 in-column SDD Super-X detectors with unique cleanliness. It delivers fast, precise, quantitative characterization of nanomaterials in multiple dimensions. With innovative precision features the Talos F200X system has been used by our team for advanced research and analysis. 

 Electrokinetic or Zeta potential measures electrochemical equilibrium and magnitude of electrostatic repulsion/attraction between particle-liquid interface. These fundamental parameters affect stability of nanoparticles,  when applied to colloidal dispersions and generally means their dispersion resistance to change within the time.  Zeta potential testing of our samples has been performed using a Malvern Zetasizer Nano ZS instrument equipped with a HeNe laser operating at 632.8 nm and a scattering detector at 173 degrees. 

Energy-dispersive X-ray spectroscopy (EDS) is an analytical technique that enables the chemical characterization/elemental analysis of nanomaterials. A sample excited by an energy source, such as the electron beam of an electron microscope, dissipates some of the absorbed energy by ejecting a core-shell electron. A higher energy outer-shell electron then proceeds to fill its place, releasing the difference in energy as an X-ray that has a characteristic spectrum based on its atom of origin. This allows for the compositional analysis of a given sample volume that has been excited by the energy source. The position of the peaks in the spectrum identifies the element, whereas the intensity of the signal corresponds to the concentration of the element. We analyzed our samples with Talos F200X STEM system, which integrates SEM and EDS functions in a single, seamless user interface.